Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Gilder Aperture Grid with Single 800 µm hole, Nickel
Single Slot aperture grids have a thickness of are 50 microns. Aperture diameter is 800 um.
Material: Nickel
Electron Microscopy Sciences EMS Strip Aperture JEOL, 100-200-300 µm holes, 9.0 x 2.35 x 0.10 mm
Strip apertures made from Platinum-Iridium (95:5).
Holes: 100-200-300 µm
Dimensions: 9.0 x 2.35 x 0.10 mm
Electron Microscopy Sciences SEM Carbon Planchet, 25.4 mm, 1.6 mm height
Carbon planchet for scanning electron microscopy (SEM).
Surface: 1"
Height: 1.6 mm
Cole-Parmer Meiji Techno MA285 Microscope Stage Micrometer, 1 mm/0.01 mm scale
Use these micrometers to make quick and accurate measurements of your specimen. Eyepiece reticles are available with a crosshair scale or a 10 mm scale in 0.1 mm divisions; stage micrometers are available with a 1 mm scale in 0.01 mm divisions or with a 0.04" scale in 0.001" divisions. Use stage micrometers with any microscope.
Electron Microscopy Sciences Hitachi 3-Position Multi-Sample Holder
A single tilt multi-grid holder. Will accommodate 3 grids with easy reproducible movement between each specimen. It is ideal for scanning through serial samples or for comparing against standards. Grids are held in place by easy to remove circlips. Comes complete with loading stand, circlip extraction tool, and is supplied in a mahogany box.
Electron Microscopy Sciences JEOL 2-Position Single Tilt Holder
A single tilt multi-grid holder. Will accommodate 6 grids with an easy click stop reproducible movement between each specimen. It is ideal for scanning through serial sections or for comparing against a standard. Grids are held in place by easy to remove circlips. Comes complete with loading stand, circlip extraction tool, and is supplied in its own mahogany box.
Electron Microscopy Sciences Philips Bulk Sample Holder for Compustage
A single-tilt multi-functional sample holder. For use in either SEM or TEM modes. Includes slit serial section tip, 10 bulk, and a TEM 3.05 mm grid holder for use with TEM or STEM. Comes supplied in its own mahogany box, with a loading stand, and a circlip extraction tool.
Electron Microscopy Sciences JEOL 3 Position Grid Insert
A three position insert which will fit standard JEOL 2 position holders as a direct replacement. Specimens are held in place with our push fit, easy to use circlips. The circlip extraction tool, Cat. #EMS016 is needed to install and remove circlips.
Electron Microscopy Sciences JEOL ISI SEM Cylinder Mount 5/8" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL and ISI scanning electron microscopes. The mounts are made from ultra-pure aluminum with standard lathe finish.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences Indexed Grid Graticle NE11A, 16 mm, 10 x 10 mm with 1.0 mm pitch
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Indexed grid marked 1-10 and A-J.
Size: 16 mm
Divisions: 10 x 10 mm with 1.0 mm pitch
Surface: Chrome image
Electron Microscopy Sciences V-2 Quality, 25 x 25 mm, 0.26- 0.31 mm thick
EMS Mica Sheets offer a clean surface for EM applications, carbon filming & particle spraying, as well as for AFM applications. There are 2 types of mica: muscovite & phlogopite. Generally, one differs from the other by color (Muscovite is Ruby, Green or White; Phlogopite is Amber, Yellow, or Silver). The max operating temp for Muscovite is about 500-600 deg C & for Phlogopite is about 800-900 deg C. Our line consists of High Quality Muscovite Mica. This mica peels off very thin up to 0.0001" uniform layers, exposing "virgin" mica upon splitting.
Muscovite, potash type mica, sometimes known as granitic mica, is the best of all micas in dielectric strength, perfection of cleavage, & transparency. It has the chem formula: H2KAI3(Si04)3. Clear & Slightly Stained. Hard, uniform color, nearly flat & slight crystallographic discoloration. Very slight air inclusions & not more than 1/4 of usable area.
Quality: V-2
Size: 25 x 25 mm
Thickness: 0.26- 0.31 mm
Electron Microscopy Sciences Veco Thin and Thick Bars 100µK, Nickel Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Material: Nickel
Pitch: 156/132 µm
Hole: 100 µm
Bar: 56/32 µm
Electron Microscopy Sciences Tripod Polisher Model 590, Kit for TEM
The Tripod Polisher is used to prepare accurately micro sizes of TEM and SEM samples. For TEM samples, the Tripod Polisher iis used to limit ion milling times to less than 15 minutes, and in some cases, has eliminated the need for ion milling. It can be used to prepare both plan-view and cross-sections from a variety of sample materials, such as ceramics, composites, metals, and geological specimens. It has limited ion milling requirements that reduce preferential thinning, radiation damage, and heating of the sample. No strong chemicals are used to prepare the specimen.